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  1 ltc2242-10 224210fb typical applicatio u sfdr vs input frequency features descriptio u sample rate: 250msps 60.5db snr 78db sfdr 1.2ghz full power bandwidth s/h single 2.5v supply low power dissipation: 740mw lvds, cmos, or demultiplexed cmos outputs selectable input ranges: 0.5v or 1v no missing codes optional clock duty cycle stabilizer shutdown and nap modes data ready output clock pin compatible family 250msps: ltc2242-12 (12-bit), ltc2242-10 (10-bit) 210msps: ltc2241-12 (12-bit), ltc2241-10 (10-bit) 170msps: ltc2240-12 (12-bit), ltc2240-10 (10-bit) 185msps: ltc2220-1 (12-bit)* 170msps: ltc2220 (12-bit), ltc2230 (10-bit)* 135msps: ltc2221 (12-bit), ltc2231 (10-bit)* 64-pin 9mm 9mm qfn package the ltc 2242-10 is a 250msps, sampling 10-bit a/d converter designed for digitizing high frequency, wide dynamic range signals. the ltc2240-10 is perfect for demanding communications applications with ac perfor- mance that includes 60.5db snr and 78db sfdr. ultralow jitter of 95fs rms allows if undersampling with excellent noise performance. dc specs include 0.4lsb inl (typ), 0.2lsb dnl (typ) and no missing codes over temperature. the digital outputs can be either differential lvds, or single-ended cmos. there are three format options for the cmos outputs: a single bus running at the full data rate or two demultiplexed buses running at half data rate with either interleaved or simultaneous update. a separate output power supply allows the cmos output swing to range from 0.5v to 2.625v. the enc + and enc inputs may be driven differentially or single ended with a sine wave, pecl, lvds, ttl, or cmos inputs. an optional clock duty cycle stabilizer allows high performance over a wide range of clock duty cycles. applicatio s u , lt, ltc and ltm are registered trademarks of linear technology corporation. all other trademarks are the property of their respective owners. *ltc2220-1, ltc2220, ltc2221, ltc2230, ltc2231 are 3.3v parts. wireless and wired broadband communication cable head-end systems power amplifier linearization communications test equipment 10-bit, 250msps adc + input s/h correction logic output drivers 10-bit pipelined adc core clock/duty cycle control flexible reference d9 d0 encode input refh refl analog input 224210 ta01 cmos or lvds 0.5v to 2.625v 2.5v v dd ov dd ognd input frequency (mhz) 0 sfdr (dbfs) 70 80 85 800 224210 g11 60 50 65 75 55 45 40 200 100 400 300 600 700 900 500 1000 1v range 2v range
2 ltc2242-10 224210fb co verter characteristics u order part number up part marking* LTC2242CUP-10 ltc2242iup-10 package/order i for atio uu w the denotes the specifications which apply over the full operating temperature range, otherwise specifications are at t a = 25 c. (note 4) *the temperature grade is identified by a label on the shipping container. consult ltc marketing for parts specified with wider operating temperature ranges. supply voltage (v dd ) .............................................. 2.8v digital output ground voltage (ognd) ....... 0.3v to 1v analog input voltage (note 3) ..... 0.3v to (v dd + 0.3v) digital input voltage .................... 0.3v to (v dd + 0.3v) digital output voltage ............... 0.3v to (ov dd + 0.3v) absolute axi u rati gs w ww u ov dd = v dd (notes 1, 2) power dissipation ............................................ 1500mw operating temperature range ltc2242c-10 .......................................... 0 c to 70 c ltc2242i-10 .......................................40 c to 85 c storage temperature range ..................65 c to 150 c order options tape and reel: add #tr lead free: add #pbf lead free tape and reel: add #trpbf lead free part marking: http://www.linear.com/leadfree/ ltc2242up-10 ltc2242up-10 parameter conditions min typ max units resolution (no missing codes) 10 bits integral linearity error differential analog input (note 5) ? 0.4 1 lsb differential linearity error differential analog input ?.7 0.2 0.7 lsb offset error (note 6) ?7 517 mv gain error external reference ?.5 0.7 3.5 %fs offset drift 10 v/c full-scale drift internal reference 60 ppm/c external reference 45 ppm/c transition noise sense = 1v 0.18 lsb rms top view up package 64-lead (9mm 9mm) plastic qfn exposed pad (pin 65) is gnd, must be soldered to pcb t jmax = 150 c, ja = 20 c/w a in + 1 a in + 2 a in 3 a in 4 refha 5 refha 6 reflb 7 reflb 8 refhb 9 refhb 10 refla 11 refla 12 v dd 13 v dd 14 v dd 15 gnd 16 48 d7 + /da4 47 d7 /da3 46 d6 + /da2 45 d6 /da1 44 d5 + /da0 43 d5 /dnc 42 ov dd 41 ognd 40 d4 + /dnc 39 d4 /clkouta 38 d3 + /clkoutb 37 d3 /ofb 36 clkout + /db9 35 clkout /db8 34 ov dd 33 ognd 64 gnd 63 v dd 62 v dd 61 gnd 60 v cm 59 sense 58 mode 57 lvds 56 of + /ofa 55 of /da9 54 d9 + /da8 53 d9 /da7 52 d8 + /da6 51 d8 /da5 50 ognd 49 ov dd enc + 17 enc 18 shdn 19 oe 20 dnc 21 dnc 22 dnc/db0 23 dnc/db1 24 ognd 25 ov dd 26 d0 /db2 27 d0 + /db3 28 d1 /db4 29 d1 + /db5 30 d2 /db6 31 d2 + /db7 32 65
3 ltc2242-10 224210fb symbol parameter conditions min typ max units snr signal-to-noise ratio (note 10) 10mhz input 60.6 db 70mhz input 59.2 60.5 db 140mhz input 60.5 db 240mhz input 60.4 db sfdr spurious free dynamic range 10mhz input 78 db 2nd or 3rd harmonic 70mhz input 63 75 db (note 11) 140mhz input 74 db 240mhz input 73 db spurious free dynamic range 10mhz input 85 db 4th harmonic or higher 70mhz input 71 85 db (note 11) 140mhz input 85 db 240mhz input 85 db s/(n+d) signal-to-noise plus 10mhz input 60.4 db distortion ratio 70mhz input 58.2 60.4 db (note 12) 140mhz input 60.3 db 240mhz input 60.2 db imd intermodulation distortion f in1 = 135mhz, f in2 = 140mhz 81 dbc a alog i put u u the denotes the specifications which apply over the full operating temperature range, otherwise specifications are at t a = 25 c. (note 4) dy a ic accuracy u w the denotes the specifications which apply over the full operating temperature range, otherwise specifications are at t a = 25 c. a in = ?dbfs. (note 4) symbol parameter conditions min typ max units v in analog input range (a in + ?a in ) 2.375v < v dd < 2.625v (note 7) 0.5 to 1v v in, cm analog input common mode (a in + + a in )/2 differential input (note 7) 1.2 1.25 1.3 v i in analog input leakage current 0 < a in + , a in < v dd ? 1 a i sense sense input leakage 0v < sense < 1v ? 1 a i mode mode pin pull-down current to gnd 7 a i lvds lvds pin pull-down current to gnd 7 a t ap sample and hold acquisition delay time 0.4 ns t jitter sample and hold acquisition delay time jitter 95 fs rms full power bandwidth figure 8 test circuit 1200 mhz
4 ltc2242-10 224210fb digital i puts a d digital outputs u u the denotes the specifications which apply over the full operating temperature range, otherwise specifications are at t a = 25 c. (note 4) i ter al refere ce characteristics uu u (note 4) parameter conditions min typ max units v cm output voltage i out = 0 1.225 1.25 1.275 v v cm output tempco 35 ppm/ c v cm line regulation 2.375v < v dd < 2.625v 3 mv/v v cm output resistance ?ma < i out < 1ma 2 symbol parameter conditions min typ max units encode inputs (enc + , enc ) v id differential input voltage (note 7) 0.2 v v icm common mode input voltage internally set 1.5 v externally set (note 7) 1.2 1.5 2.0 v r in input resistance 4.8 k c in input capacitance (note 7) 2 pf logic inputs (oe, shdn) v ih high level input voltage v dd = 2.5v 1.7 v v il low level input voltage v dd = 2.5v 0.7 v i in input current v in = 0v to v dd ?0 10 a c in input capacitance (note 7) 3 pf logic outputs (cmos mode) ov dd = 2.5v c oz hi-z output capacitance oe = high (note 7) 3 pf i source output source current v out = 0v 37 ma i sink output sink current v out = 2.5v 23 ma v oh high level output voltage i o = ?0 a 2.495 v i o = ?00 a 2.45 v v ol low level output voltage i o = 10 a 0.005 v i o = 500 a 0.07 v ov dd = 1.8v v oh high level output voltage i o = ?00 a 1.75 v v ol low level output voltage i o = 500 a 0.07 v logic outputs (lvds mode) v od differential output voltage 100 differential load 247 350 454 mv v os output common mode voltage 100 differential load 1.125 1.250 1.375 v
5 ltc2242-10 224210fb ti i g characteristics u w the denotes the specifications which apply over the full operating temperature range, otherwise specifications are at t a = 25 c. (note 4) power require e ts w u the denotes the specifications which apply over the full operating temperature range, otherwise specifications are at t a = 25 c. (note 9) symbol parameter conditions min typ max units f s sampling frequency (note 8) 1 250 mhz t l enc low time (note 7) duty cycle stabilizer off 1.9 2 500 ns duty cycle stabilizer on 1.5 2 500 ns t h enc high time (note 7) duty cycle stabilizer off 1.9 2 500 ns duty cycle stabilizer on 1.5 2 500 ns t ap sample-and-hold aperture delay 0.4 ns t oe output enable delay (note 7) 510 ns lvds output mode t d enc to data delay (note 7) 1 1.7 2.8 ns t c enc to clkout delay (note 7) 1 1.7 2.8 ns data to clkout skew (t c ?t d ) (note 7) ?.6 0 0.6 ns rise time 0.5 ns fall time 0.5 ns pipeline latency 5 cycles cmos output mode t d enc to data delay (note 7) 1 1.7 2.8 ns t c enc to clkout delay (note 7) 1 1.7 2.8 ns data to clkout skew (t c ?t d ) (note 7) ?.6 0 0.6 ns pipeline full rate cmos 5 cycles latency demuxed interleaved 5 cycles demuxed simultaneous 5 and 6 cycles symbol parameter conditions min typ max units v dd analog supply voltage (note 8) 2.375 2.5 2.625 v p sleep sleep mode power shdn = high, oe = high, no clk 1 mw p nap nap mode power shdn = high, oe = low, no clk 28 mw lvds output mode ov dd output supply voltage (note 8) 2.375 2.5 2.625 v i vdd analog supply current 285 320 ma i ovdd output supply current 58 70 ma p diss power dissipation 858 975 mw cmos output mode ov dd output supply voltage (note 8) 0.5 2.5 2.625 v i vdd analog supply current (note 7) 285 320 ma p diss power dissipation 740 mw
6 ltc2242-10 224210fb typical perfor a ce characteristics uw note 1: stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. exposure to any absolute maximum rating condition for extended periods may affect device reliability and lifetime. note 2: all voltage values are with respect to ground with gnd and ognd wired together (unless otherwise noted). note 3: when these pin voltages are taken below gnd or above v dd , they will be clamped by internal diodes. this product can handle input currents of greater than 100ma below gnd or above v dd without latchup. note 4: v dd = 2.5v, f sample = 250mhz, lvds outputs, differential enc + /enc = 2v p-p sine wave, input range = 2v p-p with differential drive, unless otherwise noted. note 5: integral nonlinearity is defined as the deviation of a code from a ?est straight line?fit to the transfer curve. the deviation is measured from the center of the quantization band. note 6: offset error is the offset voltage measured from 0.5 lsb when the output code flickers between 00 0000 0000 and 11 1111 1111 in 2? complement output mode. note 7: guaranteed by design, not subject to test. note 8: recommended operating conditions. note 9: v dd = 2.5v, f sample = 250mhz, differential enc + /enc = 2v p-p sine wave, input range = 1v p-p with differential drive, output c load = 5pf. note 10: snr minimum and typical values are for lvds mode. typical values for cmos mode are typically 0.2db lower. note 11: sfdr minimum values are for lvds mode. typical values are for both lvds and cmos modes. note 12: sinad minimum and typical values are for lvds mode. typical values for cmos mode are typically 0.2db lower. electrical characteristics integral nonlinearity differential nonlinearity 8192 point fft, f in = 5mhz, ?db, 2v range, lvds mode (t a = 25 c unless otherwise noted, note 4) output code 0 ?.0 inl (lsb) ?.8 ?.4 ?.2 0 1.0 0.4 256 512 224210 g01 ?.6 0.6 0.8 0.2 768 1024 output code 0 ?.0 dnl (lsb) ?.8 ?.4 ?.2 0 1.0 0.4 256 512 224210 g02 ?.6 0.6 0.8 0.2 768 1024 frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g03 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120
7 ltc2242-10 224210fb typical perfor a ce characteristics uw (t a = 25 c unless otherwise noted, note 4) 8192 point fft, f in = 70mhz, ?db, 2v range, lvds mode 8192 point fft, f in = 140mhz, ?db, 2v range, lvds mode 8192 point fft, f in = 240mhz, ?db, 2v range, lvds mode 8192 point fft, f in = 500mhz, ?db, 1v range, lvds mode 8192 point fft, f in = 1ghz, ?db, 1v range, lvds mode 8192 point 2-tone fft, f in = 135mhz and 140mhz, ?db, 2v range, lvds mode snr vs input frequency, ?db, lvds mode sfdr (hd2 and hd3) vs input frequency, ?db, lvds mode sfdr (hd4+) vs input frequency, ?db, lvds mode frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g04 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120 frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g05 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120 frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g06 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120 frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g07 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120 frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g08 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120 frequency (mhz) 0 amplitude (db) ?0 ?0 ?0 0 20 40 80 60 100 224210 g09 ?00 ?0 ?0 ?0 ?0 ?10 ?0 ?0 120 input frequency (mhz) 0 55 snr (dbfs) 56 57 58 600 700 800 900 62 224210 g10 100 200 300 400 500 1000 59 60 61 1v range 2v range input frequency (mhz) 0 sfdr (dbfs) 70 80 85 800 224210 g11 60 50 65 75 55 45 40 200 100 400 300 600 700 900 500 1000 1v range 2v range input frequency (mhz) 0 60 sfdr (dbfs) 65 75 80 85 95 100 500 700 224210 g12 70 90 400 900 1000 200 300 600 800 1v range 2v range
8 ltc2242-10 224210fb typical perfor a ce characteristics uw (t a = 25 c unless otherwise noted, note 4) sfdr and snr vs sample rate, 2v range, f in = 30mhz, ?db, lvds mode sfdr vs input level, f in = 70mhz, 2v range snr vs sense, f in = 5mhz, ?db i vdd vs sample rate, 5mhz sine wave input, ?db i ovdd vs sample rate, 5mhz sine wave input, ?db sample rate (msps) 0 90 85 80 75 70 65 60 55 150 200 250 224210 g13 50 100 300 sfdr and snr (dbfs) sfdr snr input level (dbfs) ?0 0 sfdr (dbc and dfbs) 10 30 40 50 90 70 ?0 ?0 ?0 224210 g14 20 80 60 ?0 dbfs dbc 0 sense pin (v) 0.5 60.0 60.5 61.0 0.9 224210 g15 59.5 59.0 0.6 0.7 0.8 1 58.5 58.0 57.5 snr (dbfs) sample rate (msps) 0 i vdd (ma) 250 260 270 150 250 224210 g16 240 230 220 50 100 200 280 290 300 2v range 1v range sample rate (msps) 0 0 i ovdd (ma) 10 20 30 40 60 50 100 150 200 250 224210 g17 50 cmos outputs o vdd = 1.8v lvds outputs o vdd = 2.5v
9 ltc2242-10 224210fb a in + (pins 1, 2): positive differential analog input. a in (pins 3, 4): negative differential analog input. refha (pins 5, 6): adc high reference. bypass to pins 7, 8 with 0.1 f ceramic chip capacitor, to pins 11, 12 with a 2.2 f ceramic capacitor and to ground with 1 f ceramic capacitor. reflb (pins 7, 8): adc low reference. bypass to pins 5, 6 with 0.1 f ceramic chip capacitor. do not connect to pins 11, 12. refhb (pins 9, 10): adc high reference. bypass to pins 11, 12 with 0.1 f ceramic chip capacitor. do not connect to pins 5, 6. refla (pins 11, 12): adc low reference. bypass to pins 9, 10 with 0.1 f ceramic chip capacitor, to pins 5, 6 with a 2.2 f ceramic capacitor and to ground with 1 f ceramic capacitor. v dd (pins 13, 14, 15, 62, 63): 2.5v supply. bypass to gnd with 0.1 f ceramic chip capacitors. gnd (pins 16, 61, 64): adc power ground. enc + (pin 17): encode input. conversion starts on the positive edge. enc (pin 18): encode complement input. conversion starts on the negative edge. bypass to ground with 0.1 f ceramic for single-ended encode signal. shdn (pin 19): shutdown mode selection pin. connect- ing shdn to gnd and oe to gnd results in normal operation with the outputs enabled. connecting shdn to gnd and oe to v dd results in normal operation with the outputs at high impedance. connecting shdn to v dd and oe to gnd results in nap mode with the outputs at high impedance. connecting shdn to v dd and oe to v dd results in sleep mode with the outputs at high impedance. oe (pin 20): output enable pin. refer to shdn pin function. dnc (pins 21, 22, 40, 43): do not connect these pins. db0-db9 (pins 23, 24, 27, 28, 29, 30, 31, 32, 35, 36): digital outputs, b bus. db9 is the msb. at high impedance in full rate cmos mode. ognd (pins 25, 33, 41, 50): output driver ground. ov dd (pins 26, 34, 42, 49): positive supply for the output drivers. bypass to ground with 0.1 f ceramic chip capacitor. uu u pi fu ctio s ofb (pin 37): over/under flow output for b bus. high when an over or under flow has occurred. at high imped- ance in full rate cmos mode. clkoutb (pin 38): data valid output for b bus. in demux mode with interleaved update, latch b bus data on the falling edge of clkoutb. in demux mode with simulta- neous update, latch b bus data on the rising edge of clkoutb. this pin does not become high impedance in full rate cmos mode. clkouta (pin 39): data valid output for a bus. latch a bus data on the falling edge of clkouta. da0-da9 (pins 44, 45, 46, 47, 48, 51, 52, 53, 54, 55): digital outputs, a bus. da9 is the msb. ofa (pin 56): over/under flow output for a bus. high when an over or under flow has occurred. lvds (pin 57): output mode selection pin. connecting lvds to 0v selects full rate cmos mode. connecting lvds to 1/3v dd selects demux cmos mode with simulta- neous update. connecting lvds to 2/3v dd selects demux cmos mode with interleaved update. connecting lvds to v dd selects lvds mode. mode (pin 58): output format and clock duty cycle stabilizer selection pin. connecting mode to 0v selects offset binary output format and turns the clock duty cycle stabilizer off. connecting mode to 1/3v dd selects offset binary output format and turns the clock duty cycle stabilizer on. connecting mode to 2/3v dd selects 2? complement output format and turns the clock duty cycle stabilizer on. connecting mode to v dd selects 2? complement output format and turns the clock duty cycle stabilizer off. sense (pin 59): reference programming pin. connecting sense to v cm selects the internal reference and a 0.5v input range. connecting sense to v dd selects the internal reference and a 1v input range. an external reference greater than 0.5v and less than 1v applied to sense selects an input range of v sense . 1v is the largest valid input range. v cm (pin 60): 1.25v output and input common mode bias. bypass to ground with 2.2 f ceramic chip capacitor. gnd (exposed pad) (pin 65): adc power ground. the exposed pad on the bottom of the package needs to be soldered to ground. (cmos mode)
10 ltc2242-10 224210fb uu u pi fu ctio s ain + (pins 1, 2): positive differential analog input. ain (pins 3, 4): negative differential analog input. refha (pins 5, 6): adc high reference. bypass to pins 7, 8 with 0.1 f ceramic chip capacitor, to pins 11, 12 with a 2.2 f ceramic capacitor and to ground with 1 f ceramic capacitor. reflb (pins 7, 8): adc low reference. bypass to pins 5, 6 with 0.1 f ceramic chip capacitor. do not connect to pins 11, 12. refhb (pins 9, 10): adc high reference. bypass to pins 11, 12 with 0.1 f ceramic chip capacitor. do not connect to pins 5, 6. refla (pins 11, 12): adc low reference. bypass to pins 9, 10 with 0.1 f ceramic chip capacitor, to pins 5, 6 with a 2.2 f ceramic capacitor and to ground with 1 f ceramic capacitor. v dd (pins 13, 14, 15, 62, 63): 2.5v supply. bypass to gnd with 0.1 f ceramic chip capacitors. gnd (pins 16, 61, 64): adc power ground. enc + (pin 17): encode input. conversion starts on the positive edge. enc (pin 18): encode complement input. conversion starts on the negative edge. bypass to ground with 0.1 f ceramic for single-ended encode signal. shdn (pin 19): shutdown mode selection pin. connect- ing shdn to gnd and oe to gnd results in normal operation with the outputs enabled. connecting shdn to gnd and oe to v dd results in normal operation with the outputs at high impedance. connecting shdn to v dd and oe to gnd results in nap mode with the outputs at high impedance. connecting shdn to v dd and oe to v dd results in sleep mode with the outputs at high impedance. oe (pin 20): output enable pin. refer to shdn pin function. dnc (pins 21, 22, 23, 24): do not connect these pins. d0 /d0 + to d9 /d9 + (pins 27, 28, 29, 30, 31, 32, 37, 38, 39, 40, 43, 44, 45, 46, 47, 48, 51, 52, 53, 54): lvds digital outputs. all lvds outputs require differential 100 termination resistors at the lvds receiver. d9 /d9 + is the msb. ognd (pins 25, 33, 41, 50): output driver ground. ov dd (pins 26, 34, 42, 49): positive supply for the output drivers. bypass to ground with 0.1 f ceramic chip capacitor. clkout /clkout + (pins 35 to 36): lvds data valid output. latch data on rising edge of clkout , falling edge of clkout + . of /of + (pins 55 to 56): lvds over/under flow output. high when an over or under flow has occurred. lvds (pin 57): output mode selection pin. connecting lvds to 0v selects full rate cmos mode. connecting lvds to 1/3v dd selects demux cmos mode with simulta- neous update. connecting lvds to 2/3v dd selects demux cmos mode with interleaved update. connecting lvds to v dd selects lvds mode. mode (pin 58): output format and clock duty cycle stabilizer selection pin. connecting mode to 0v selects offset binary output format and turns the clock duty cycle stabilizer off. connecting mode to 1/3v dd selects offset binary output format and turns the clock duty cycle stabilizer on. connecting mode to 2/3v dd selects 2? complement output format and turns the clock duty cycle stabilizer on. connecting mode to v dd selects 2? complement output format and turns the clock duty cycle stabilizer off. sense (pin 59): reference programming pin. connecting sense to v cm selects the internal reference and a 0.5v input range. connecting sense to v dd selects the internal reference and a 1v input range. an external reference greater than 0.5v and less than 1v applied to sense selects an input range of v sense . 1v is the largest valid input range. v cm (pin 60): 1.25v output and input common mode bias. bypass to ground with 2.2 f ceramic chip capacitor. gnd (exposed pad) (pin 65): adc power ground. the exposed pad on the bottom of the package needs to be soldered to ground. (lvds mode)
11 ltc2242-10 224210fb fu n ctio n al block diagra uu w figure 1. functional block diagram diff ref amp ref buf 2.2 f 1 f 0.1 f 0.1 f 1 f internal clock signals refh refl differential input low jitter clock driver range select 1.25v reference first pipelined adc stage fifth pipelined adc stage fourth pipelined adc stage second pipelined adc stage enc + refha reflb refla refhb enc shift register and correction oe m0de ognd of ov dd d9 d0 clkout 224210 f01 input s/h sense v cm a in a in + 2.2 f third pipelined adc stage output drivers control logic lvds shdn + + + + v dd gnd
12 ltc2242-10 224210fb ti i g diagra s w u w lvds output mode timing all outputs are differential and have lvds levels full-rate cmos output mode timing all outputs are single-ended and have cmos levels t h t d t c t l n ?5 n ?4 n ?3 n ?2 n ?1 t ap n + 1 n + 2 n + 4 n + 3 n analog input enc enc + clkout clkout + d0-d9, of 224210 td01 t ap n + 1 n + 2 n + 4 n + 3 n analog input t h t d t c t l n ?5 n ?4 n ?3 n ?2 n ?1 enc enc + clkoutb clkouta da0-da9, ofa db0-db9, ofb 224210 td02 high impedance
13 ltc2242-10 224210fb demultiplexed cmos outputs with interleaved update all outputs are single-ended and have cmos levels demultiplexed cmos outputs with simultaneous update all outputs are single-ended and have cmos levels ti i g diagra s w u w t h t d t c t c t d t l n ?5 n ?3 n ?1 n ?6 n ?4 n ?2 enc enc + clkoutb clkouta da0-da9, ofa db0-db9, ofb 224210 td03 t ap n + 1 n + 2 n + 4 n + 3 n analog input t h t d t c t d t l n ?6 n ?4 n ?2 n ?5 n ?3 n ?1 enc enc + clkoutb clkouta da0-da9, ofa db0-db9, ofb 224210 td04 t ap n + 1 n + 2 n + 4 n + 3 n analog input
14 ltc2242-10 224210fb applicatio s i for atio wu u u dynamic performance signal-to-noise plus distortion ratio the signal-to-noise plus distortion ratio [s/(n + d)] is the ratio between the rms amplitude of the fundamental input frequency and the rms amplitude of all other frequency components at the adc output. the output is band limited to frequencies above dc to below half the sampling frequency. signal-to-noise ratio the signal-to-noise ratio (snr) is the ratio between the rms amplitude of the fundamental input frequency and the rms amplitude of all other frequency components except the first five harmonics and dc. total harmonic distortion total harmonic distortion is the ratio of the rms sum of all harmonics of the input signal to the fundamental itself. the out-of-band harmonics alias into the frequency band between dc and half the sampling frequency. thd is expressed as: thd log v v v vn v =+++ () ? ? ? ? ? ? 20 2 3 4 1 222 2 ... / where v1 is the rms amplitude of the fundamental fre- quency and v2 through vn are the amplitudes of the second through nth harmonics. the thd calculated in this data sheet uses all the harmonics up to the fifth. intermodulation distortion if the adc input signal consists of more than one spectral component, the adc transfer function nonlinearity can produce intermodulation distortion (imd) in addition to thd. imd is the change in one sinusoidal input caused by the presence of another sinusoidal input at a different frequency. if two pure sine waves of frequencies fa and fb are applied to the adc input, nonlinearities in the adc transfer func- tion can create distortion products at the sum and differ- ence frequencies of mfa nfb, where m and n = 0, 1, 2, 3, etc. the 3rd order intermodulation products are 2fa + fb, 2fb + fa, 2fa ?fb and 2fb ?fa. the intermodulation distortion is defined as the ratio of the rms value of either input tone to the rms value of the largest 3rd order intermodulation product. spurious free dynamic range (sfdr) spurious free dynamic range is the peak harmonic or spurious noise that is the largest spectral component excluding the input signal and dc. this value is expressed in decibels relative to the rms value of a full scale input signal. full power bandwidth the full power bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is re- duced by 3db for a full scale input signal. aperture delay time the time from when a rising enc + equals the enc voltage to the instant that the input signal is held by the sample and hold circuit. aperture delay jitter the variation in the aperture delay time from conversion to conversion. this random variation will result in noise when sampling an ac input. the signal to noise ratio due to the jitter alone will be: snr jitter = ?0log (2 ?f in ?t jitter ) converter operation as shown in figure 1, the ltc2242-10 is a cmos pipelined multi-step converter. the converter has five pipelined adc stages; a sampled analog input will result in a digitized value five cycles later (see the timing diagram section). for optimal performance the analog inputs should be driven differentially. the encode input is differential for improved common mode noise immunity. the ltc2242-10 has two phases of operation, determined by the state of the differential enc + /enc input pins. for brevity, the text will refer to enc + greater than enc as enc high and enc + less than enc as enc low.
15 ltc2242-10 224210fb applicatio s i for atio wu uu figure 2. equivalent input circuit each pipelined stage shown in figure 1 contains an adc, a reconstruction dac and an interstage residue amplifier. in operation, the adc quantizes the input to the stage and the quantized value is subtracted from the input by the dac to produce a residue. the residue is amplified and output by the residue amplifier. successive stages operate out of phase so that when the odd stages are outputting their residue, the even stages are acquiring that residue and vice versa. when enc is low, the analog input is sampled differentially directly onto the input sample-and-hold capacitors, inside the ?nput s/h?shown in the block diagram. at the instant that enc transitions from low to high, the sampled input is held. while enc is high, the held input voltage is buffered by the s/h amplifier which drives the first pipelined adc stage. the first stage acquires the output of the s/h during this high phase of enc. when enc goes back low, the first stage produces its residue which is acquired by the second stage. at the same time, the input s/h goes back to acquiring the analog input. when enc goes back high, the second stage produces its residue which is acquired by the third stage. an identical process is re- peated for the third and fourth stages, resulting in a fourth stage residue that is sent to the fifth stage adc for final evaluation. each adc stage following the first has additional range to accommodate flash and amplifier offset errors. results from all of the adc stages are digitally synchronized such that the results can be properly combined in the correction logic before being sent to the output buffer. sample/hold operation and input drive sample/hold operation figure 2 shows an equivalent circuit for the ltc2242-10 cmos differential sample-and-hold. the analog inputs are connected to the sampling capacitors (c sample ) through nmos transistors. the capacitors shown attached to each input (c parasitic ) are the summation of all other capaci- tance associated with each input. during the sample phase when enc is low, the transistors connect the analog inputs to the sampling capacitors and they charge to, and track the differential input voltage. when enc transitions from low to high, the sampled input voltage is held on the sampling capacitors. during the hold phase when enc is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the adc core for processing. as enc transitions from high to low, the inputs are reconnected to the sampling capacitors to acquire a new sample. since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. if the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. if the input change is large, such as the change seen with input frequencies near nyquist, then a larger charging glitch will be seen. common mode bias for optimal performance the analog inputs should be driven differentially. each input should swing 0.5v for the 2v range or 0.25v for the 1v range, around a common mode voltage of 1.25v. the v cm output pin (pin 60) may be used to provide the common mode bias level. v cm can be tied directly to the center tap of a transformer to set the dc input level or as a reference level to an op amp c sample 2pf r on 14 r on 14 v dd v dd ltc2242-10 a in + 224210 f02 c sample 2pf v dd a in enc enc + 1.5v 6k 1.5v 6k c parasitic 1.8pf c parasitic 1.8pf 10 10
16 ltc2242-10 224210fb applicatio s i for atio wu uu figure 5. capacitively-coupled drive figure 4. differential drive with an amplifier figure 3. single-ended to differential conversion using a transformer differential driver circuit. the v cm pin must be bypassed to ground close to the adc with a 2.2 f or greater capacitor. input drive impedance as with all high performance, high speed adcs, the dynamic performance of the ltc2242-10 can be influ- enced by the input drive circuitry, particularly the second and third harmonics. source impedance and input reac- tance can influence sfdr. at the falling edge of enc, the sample-and-hold circuit will connect the 2pf sampling capacitor to the input pin and start the sampling period. the sampling period ends when enc rises, holding the sampled input on the sampling capacitor. ideally the input circuitry should be fast enough to fully charge the sam- pling capacitor during the sampling period 1/(2f s ); how- ever, this is not always possible and the incomplete settling may degrade the sfdr. the sampling glitch has been designed to be as linear as possible to minimize the effects of incomplete settling. for the best performance, it is recommended to have a source impedance of 100 or less for each input. the source impedance should be matched for the differential inputs. poor matching will result in higher even order harmonics, especially the second. input drive circuits figure 3 shows the ltc2242-10 being driven by an rf transformer with a center tapped secondary. the second- ary center tap is dc biased with v cm , setting the adc input signal at its optimum dc level. terminating on the trans- former secondary is desirable, as this provides a common mode path for charging glitches caused by the sample and hold. figure 3 shows a 1:1 turns ratio transformer. other turns ratios can be used if the source impedance seen by the adc does not exceed 100 for each adc input. a disadvantage of using a transformer is the loss of low frequency response. most small rf transformers have poor performance at frequencies below 1mhz. figure 4 demonstrates the use of a differential amplifier to convert a single ended input signal into a differential input signal. the advantage of this method is that it provides low frequency input response; however, the limited gain bandwidth of most op amps will limit the sfdr at high input frequencies. figure 5 shows a capacitively-coupled input circuit. the im- pedance seen by the analog inputs should be matched. the 25 resistors and 12pf capacitor on the analog inputs serve two purposes: isolating the drive circuitry from the 25 25 25 25 10 0.1 f a in + a in + a in a in 12pf 2.2 f v cm ltc2242-10 analog input 0.1 ft1 1:1 t1 = ma/com etc1-1t resistors, capacitors are 0402 package size 224210 f03 25 25 50 a in + a in + a in a in 12pf 2.2 f 3pf v cm ltc2242-10 224210 f04 + + cm analog input high speed differential amplifier 3pf 0.1 f 25 0.1 f v cm a in + a in + a in a in 100 100 analog input 12pf 224210 f05 2.2 f 0.1 f 25 ltc2242-10
17 ltc2242-10 224210fb applicatio s i for atio wu uu figure 8. recommended front end circuit for input frequencies above 500mhz figure 6. recommended front end circuit for input frequencies between 100mhz and 250mhz figure 7. recommended front end circuit for input frequencies between 250mhz and 500mhz sample-and-hold charging glitches and limiting the wideband noise at the converter input. for input frequen- cies higher than 100mhz, the capacitor may need to be decreased to prevent excessive signal loss. the a in + and a in ? inputs each have two pins to reduce package inductance. the two a in + and the two a in pins should be shorted together. for input frequencies above 100mhz the input circuits of figure 6, 7 and 8 are recommended. the balun transformer gives better high frequency response than a flux coupled center tapped transformer. the coupling capacitors allow the analog inputs to be dc biased at 1.25v. in figure 8 the series inductors are impedance matching elements that maximize the adc bandwidth. reference operation figure 9 shows the ltc2242-10 reference circuitry con- sisting of a 1.25v bandgap reference, a difference ampli- fier and switching and control circuit. the internal voltage reference can be configured for two pin selectable input ranges of 2v ( 1v differential) or 1v ( 0.5v differential). tying the sense pin to v dd selects the 2v range; typing the sense pin to v cm selects the 1v range. the 1.25v bandgap reference serves two functions: its output provides a dc bias point for setting the common mode voltage of any external input circuitry; additionally, the reference is used with a difference amplifier to gener- ate the differential reference levels needed by the internal adc circuitry. an external bypass capacitor is required for the 1.25v reference output, v cm . this provides a high frequency low impedance path to ground for internal and external circuitry. the difference amplifier generates the high and low refer- ence for the adc. high speed switching circuits are connected to these outputs and they must be externally bypassed. each output has four pins: two each of refha and refhb for the high reference and two each of refla and reflb for the low reference. the multiple output pins are needed to reduce package inductance. bypass capaci- tors must be connected as shown in figure 9. 25 25 12 12 10 0.1 f a in + a in + a in a in 8pf 2.2 f v cm analog input 0.1 f 0.1 f t1 t1 = ma/com etc1-1-13 resistors, capacitors are 0402 package size 224210 f06 ltc2242-10 25 10 25 0.1 f a in + a in + a in a in 2.2 f v cm analog input 0.1 f 0.1 f t1 t1 = ma/com etc1-1-13 resistors, capacitors are 0402 package size 224210 f07 ltc2242-10 25 10 25 0.1 f a in + a in + a in a in 2.2 f v cm ltc2242-10 analog input 0.1 f 0.1 f t1 t1 = ma/com etc1-1-13 resistors, capacitors are 0402 package size 224210 f08 2.7nh 2.7nh
18 ltc2242-10 224210fb applicatio s i for atio wu uu figure 9. equivalent reference circuit figure 10. 1.5v range adc other voltage ranges in between the pin selectable ranges can be programmed with two external resistors as shown in figure 10. an external reference can be used by applying its output directly or through a resistor divider to sense. it is not recommended to drive the sense pin with a logic device. the sense pin should be tied to the appropriate level as close to the converter as possible. if the sense pin is driven externally, it should be bypassed to ground as close to the device as possible with a 1 f ceramic capacitor. input range the input range can be set based on the application. the 2v input range will provide the best signal-to-noise perfor- mance while maintaining excellent sfdr. the 1v input range will have better sfdr performance, but the snr will degrade by 1.7db. see the typical performance charac- teristics section. driving the encode inputs the noise performance of the ltc2242-10 can depend on the encode signal quality as much as on the analog input. the enc + /enc inputs are intended to be driven differentially, primarily for noise immunity from com- mon mode noise sources. each input is biased through a 4.8k resistor to a 1.5v bias. the bias resistors set the dc operating point for transformer coupled drive circuits and can set the logic threshold for single-ended drive circuits. any noise present on the encode signal will result in additional aperture jitter that will be rms summed with the inherent adc aperture jitter. in applications where jitter is critical (high input frequen- cies) take the following into consideration: 1. differential drive should be used. 2. use as large an amplitude as possible; if transformer coupled use a higher turns ratio to increase the amplitude. 3. if the adc is clocked with a sinusoidal signal, filter the encode signal to reduce wideband noise. 4. balance the capacitance and series resistance at both encode inputs so that any coupled noise will appear at both inputs as common mode noise. the encode inputs have a common mode range of 1.2v to 2.0v. each input may be driven from ground to v dd for single-ended drive. v cm refha reflb sense tie to v dd for 2v range; tie to v cm for 1v range; range = 2 ?v sense for 0.5v < v sense < 1v 1.25v refla refhb 2.2 f 2.2 f internal adc high reference buffer 0.1 f 224210 f09 ltc2242-10 2 diff amp 1 f 1 f 0.1 f internal adc low reference 1.25v bandgap reference 1v 0.5v range detect and control v cm sense 1.25v 2.2 f 8k 12k 0.75v 1 f 224210 f10 ltc2242-10
19 ltc2242-10 224210fb applicatio s i for atio wu uu figure 11. transformer driven enc + /enc figure 12a. single-ended enc drive, not recommended for low jitter figure 12b. enc drive using lvds maximum and minimum encode rates the maximum encode rate for the ltc2242-10 is 250msps. for the adc to operate properly, the encode signal should have a 50% ( 5%) duty cycle. each half cycle must have at least 1.9ns for the adc internal circuitry to have enough settling time for proper operation. achieving a precise 50% duty cycle is easy with differential sinusoidal drive using a transformer or using symmetric differential logic such as pecl or lvds. an optional clock duty cycle stabilizer circuit can be used if the input clock has a non 50% duty cycle. this circuit uses the rising edge of the enc + pin to sample the analog input. the falling edge of enc + is ignored and the internal falling edge is generated by a phase-locked loop. the input clock duty cycle can vary from 40% to 60% and the clock duty cycle stabilizer will maintain a constant 50% internal duty cycle. if the clock is turned off for a long period of time, the duty cycle stabilizer circuit will require one hundred clock cycles for the pll to lock onto the input clock. to use the clock duty cycle stabilizer, the mode pin should be connected to 1/3v dd or 2/3v dd using external resistors. the lower limit of the ltc2242-10 sample rate is deter- mined by droop of the sample-and-hold circuits. the pipelined architecture of this adc relies on storing analog signals on small valued capacitors. junction leakage will discharge the capacitors. the specified minimum operat- ing frequency for the ltc2242-10 is 1msps. digital outputs table 1 shows the relationship between the analog input voltage, the digital data bits, and the overflow bit. v dd v dd ltc2242-10 224210 f11 v dd enc enc + 1.5v bias 1.5v bias 0.1 f t1 ma/com etc1-1-13 clock input 100 8.2pf 0.1 f 0.1 f 50 50 4.8k 4.8k to internal adc circuits 224210 f12a enc 1.5v v threshold = 1.5v enc + 0.1 f ltc2242-10 224210 f12b enc enc + lvds clock 100 0.1 f ltc2242-10 0.1 f
20 ltc2242-10 224210fb applicatio s i for atio wu uu table 2. lvds pin function lvds digital output mode gnd full-rate cmos 1/3v dd demultiplexed cmos, simultaneous update 2/3v dd demultiplexed cmos, interleaved update v dd lvds digital output modes the ltc2242-10 can operate in several digital output modes: lvds, cmos running at full speed, and cmos demultiplexed onto two buses, each of which runs at half speed. in the demultiplexed cmos modes the two buses (referred to as bus a and bus b) can either be updated on alternate clock cycles (interleaved mode) or simultaneously (simultaneous mode). for details on the clock timing, refer to the timing diagrams. the lvds pin selects which digital output mode the part uses. this pin has a four-level logic input which should be connected to gnd, 1/3v dd , 2/3v dd or v dd . an external resistor divider can be used to set the 1/3v dd or 2/3v dd logic values. table 2 shows the logic states for the lvds pin. digital output buffers (cmos modes) figure 13a shows an equivalent circuit for a single output buffer in the cmos output mode. each buffer is powered by ov dd and ognd, which are isolated from the adc power and ground. the additional n-channel transis- tor in the output driver allows operation down to voltages as low as 0.5v. the internal resistor in series with the output makes the output appear as 50 to external cir- cuitry and may eliminate the need for external damping resistors. as with all high speed/high resolution converters, the digi- tal output loading can affect the performance. the digital outputs of the ltc2242-10 should drive a minimal capaci- tive load to avoid possible interaction between the digital outputs and sensitive input circuitry. the output should be buffered with a device such as an 74vcx245 cmos latch. for full speed operation the capacitive load should be kept under 10pf. lower ov dd voltages will also help reduce interference from the digital outputs. digital output buffers (lvds mode) figure 13b shows an equivalent circuit for a differential output pair in the lvds output mode. a 3.5ma current is steered from out + to out or vice versa which creates a 350mv differential voltage across the 100 termination resistor at the lvds receiver. a feedback loop regulates the common mode output voltage to 1.25v. for proper operation each lvds output pair needs an external 100 termination resistor, even if the signal is not used (such as of + /of or clkout + /clkout ). to minimize noise the pc board traces for each lvds output pair should be routed close together. to minimize clock skew all lvds pc board traces should have about the same length. table 1. output codes vs input voltage a in + ?a in d9 ?d0 d9 ?d0 (2v range) of (offset binary) (2? complement) >+1.000000v 1 11 1111 1111 01 1111 1111 +0.998047v 0 11 1111 1111 01 1111 1111 +0.996094v 0 11 1111 1110 01 1111 1110 +0.001953v 0 10 0000 0001 00 0000 0001 0.000000v 0 10 0000 0000 00 0000 0000 ?.001953v 0 01 1111 1111 11 1111 1111 ?.003906v 0 01 1111 1110 11 1111 1110 ?.998047v 0 00 0000 0001 10 0000 0001 ?.000000v 0 00 0000 0000 10 0000 0000 21 ltc2242-10 224210fb applicatio s i for atio wu uu figure 13b. digital output in lvds mode figure 13a. digital output buffer in cmos mode table 3. mode pin function clock duty mode pin output format cycle stabilizer 0 offset binary off 1/3v dd offset binary on 2/3v dd 2? complement on v dd 2? complement off data format the ltc2242-10 parallel digital output can be selected for offset binary or 2? complement format. the format is selected with the mode pin. connecting mode to gnd or 1/3v dd selects offset binary output format. connecting mode to 2/3v dd or v dd selects 2? complement output format. an external resistor divider can be used to set the 1/3v dd or 2/3v dd logic values. table 3 shows the logic states for the mode pin. overflow bit an overflow output bit indicates when the converter is overranged or underranged. in cmos mode, a logic high on the ofa pin indicates an overflow or underflow on the a data bus, while a logic high on the ofb pin indicates an overflow or underflow on the b data bus. in lvds mode, a differential logic high on the of + /of pins indicates an overflow or underflow. output clock the adc has a delayed version of the enc + input available as a digital output, clkout. the clkout pin can be used to synchronize the converter data to the digital system. this is necessary when using a sinusoidal encode. in all cmos modes, a bus data will be updated just after clkouta rises and can be latched on the falling edge of clkouta. in demux cmos mode with interleaved update, b bus data will be updated just after clkoutb rises and can be latched on the falling edge of clkoutb. in demux cmos mode with si- multaneous update, b bus data will be updated just after clkoutb falls and can be latched on the rising edge of clkoutb. in lvds mode, data will be updated just after clkout + /clkout rises and can be latched on the falling edge of clkout + /clkout . output driver power separate output power and ground pins allow the output drivers to be isolated from the analog circuitry. the power supply for the digital output buffers, ov dd , should be tied to the same power supply as for the logic being driven. for example if the converter is driving a dsp powered by a 1.8v supply then ov dd should be tied to that same 1.8v supply. in the cmos output mode, ov dd can be powered with any voltage up to 2.625v. ognd can be powered with any volt- age from gnd up to 1v and must be less than ov dd . the logic outputs will swing between ognd and ov dd . in the lvds output mode, ov dd should be connected to a 2.5v supply and ognd should be connected to gnd. ltc2242-10 224210 f13a ov dd v dd v dd 0.1 f 43 typical data output ognd ov dd 0.5v to 2.625v predriver logic data from latch oe ltc2242-10 224210 f13b ov dd lvds receiver ognd 1.25v d d d d out + 0.1 f 2.5v out 100 + 3.5ma 10k 10k
22 ltc2242-10 224210fb applicatio s i for atio wu uu output enable the outputs may be disabled with the output enable pin, oe. in cmos or lvds output modes oe high disables all data outputs including of and clkout. the data access and bus relinquish times are too slow to allow the outputs to be enabled and disabled during full speed operation. the output hi-z state is intended for use during long periods of inactivity. the hi-z state is not a truly open circuit; the output pins that make an lvds output pair have a 20k resistance between them. therefore in the cmos output mode, adjacent data bits will have 20k resistance in between them, even in the hi-z state. sleep and nap modes the converter may be placed in shutdown or nap modes to conserve power. connecting shdn to gnd results in normal operation. connecting shdn to v dd and oe to v dd results in sleep mode, which powers down all circuitry including the reference and typically dissipates 1mw. when exiting sleep mode it will take milliseconds for the output data to become valid because the reference capacitors have to recharge and stabilize. connecting shdn to v dd and oe to gnd results in nap mode, which typically dissipates 28mw. in nap mode, the on-chip reference circuit is kept on, so that recovery from nap mode is faster than that from sleep mode, typically taking 100 clock cycles. in both sleep and nap mode all digital outputs are disabled and enter the hi-z state. grounding and bypassing the ltc2242-10 requires a printed circuit board with a clean unbroken ground plane. a multilayer board with an inter- nal ground plane is recommended. layout for the printed circuit board should ensure that digital and analog signal lines are separated as much as possible. in particular, care should be taken not to run any digital signal alongside an analog signal or underneath the adc. high quality ceramic bypass capacitors should be used at the v dd , ov dd , v cm , refha, refhb, refla and reflb pins. bypass capacitors must be located as close to the pins as possible. of particular importance are the capacitors between refha and reflb and between refhb and refla. these capacitors should be as close to the device as possible (1.5mm or less). size 0402 ceramic capacitors are recommended. the 2.2 f capacitor between refha and refla can be somewhat further away. the traces connect- ing the pins and bypass capacitors must be kept short and should be made as wide as possible. the ltc2242-10 differential inputs should run parallel and close to each other. the input traces should be as short as possible to minimize capacitance and to minimize noise pickup. heat transfer most of the heat generated by the ltc2242-10 is transferred from the die through the bottom-side exposed pad and package leads onto the printed circuit board. for good electrical and thermal performance, the exposed pad should be soldered to a large grounded pad on the pc board. it is critical that all ground pins are connected to a ground plane of sufficient area. clock sources for undersampling undersampling is especially demanding on the clock source and the higher the input frequency, the greater the sensitivity to clock jitter or phase noise. a clock source that degrades snr of a full-scale signal by 1db at 70mhz will degrade snr by 3db at 140mhz, and 4.5db at 190mhz. in cases where absolute clock frequency accuracy is relatively unimportant and only a single adc is required, a canned oscillator from vendors such as saronix or vectron can be placed close to the adc and simply connected directly to the adc. if there is any distance to the adc, some source termination to reduce ringing that may occur even over a fraction of an inch is advisable. you must not allow the clock to overshoot the supplies or performance will suffer. do not filter the clock signal with a narrow band filter unless you have a sinusoidal clock source, as the rise and fall time artifacts present in typical digital clock signals will be translated into phase noise.
23 ltc2242-10 224210fb applicatio s i for atio wu uu the lowest phase noise oscillators have single-ended sinusoidal outputs, and for these devices the use of a filter close to the adc may be beneficial. this filter should be close to the adc to both reduce roundtrip reflection times, as well as reduce the susceptibility of the traces between the filter and the adc. if the circuit is sensitive to close- in phase noise, the power supply for oscillators and any buffers must be very stable, or propagation delay varia- tion with supply will translate into phase noise. even though these clock sources may be regarded as digital devices, do not operate them on a digital supply. if your clock is also used to drive digital devices such as an fpga, you should locate the oscillator, and any clock fan-out devices close to the adc, and give the routing to the adc precedence. the clock signals to the fpga should have series termination at the driver to prevent high frequency noise from the fpga disturbing the substrate of the clock fan-out device. if you use an fpga as a programmable divider, you must re-time the signal using the original oscillator, and the re-timing flip-flop as well as the oscil- lator should be close to the adc, and powered with a very quiet supply. for cases where there are multiple adcs, or where the clock source originates some distance away, differential clock distribution is advisable. this is advisable both from the perspective of emi, but also to avoid receiving noise from digital sources both radiated, as well as propagated in the waveguides that exist between the layers of multi- layer pcbs. the differential pairs must be close together and distanced from other signals. the differential pair should be guarded on both sides with copper distanced at least 3x the distance between the traces, and grounded with vias no more than 1/4 inch apart.
24 ltc2242-10 224210fb applicatio s i for atio wu uu evaluation circuit schematic of the ltc2242-10 a in + a in + a in a in refha refha reflb reflb refhb refhb refla refla c19 0.1 f 2 1 4 3 6 5 8 7 10 9 12 11 56 55 54 53 52 51 48 47 46 45 44 43 40 39 38 37 36 35 32 31 30 29 28 27 24 23 22 21 r17 100 r3 100 r7 1k r37 blm18bb470sn1d r38 100 r39 100 r40 100 r42 100 r43 100 r18 100 r19 100 r20 100 r21 100 r22 100 r28 100 r30 100 24 of + /ofa of /da9 d9 + /da8 d9 /da7 d8 + /da6 d8 /da5 d7 + /da4 d7 /da3 d6 + /da2 d6 /da1 d5 + /da0 d5 /dnc d4 + /dnc d4 /clkouta d3 + /clkoutb d3 /ofb clkout + /db9 clkout /db8 d2 + /db7 d2 /db6 d1 + /db5 d1 /db4 d0 + /db3 d0 /db2 dnc/db1 dnc/db0 dnc dnc ltc2242-10 gnd gnd gnd gnd v dd v dd v dd v dd v dd 65 64 61 16 63 62 15 14 13 c26 0.1 f c25 0.1 f 2.5v ov dd ov dd ov dd ov dd ognd ognd ognd ognd 25 33 41 50 26 34 42 49 tp6 v cm enc+ enc shdn oe sense mode lvds v cm c20 0.1 f c21 0.1 f c23 0.1 f c22 0.1 f lvds buffer bypass lt1763cs8-2.5 tp1 ext ref tp2 gnd shdn 3 v dd 1 gnd 5 4 oe 2 v dd 6 gnd 2.5v 1 v cm 3 ext ref 5 2 4 6 17 18 60 19 20 59 58 57 2.5v 2.5v 2.5v r24 1k j4 sense 1 v dd 3 gnd 5 2 4 2/3 6 1/3 j2 mode r6 1k r8 1k in shdn vo sen byp 1 2 4 8 5 gnd gnd gnd 367 c38 0.01 f c34 0.1 f c36 4.7 f j6 aux pwr connector c24 10 f c28 0.1 f c29 0.1 f 2.5v 3.3v 3.3v tp5 gnd tp4 2.5v tp3 (no turret) 1 2 3 c30 0.1 f c31 0.1 f c32 0.1 f c33 0.1 f c5 0.1 f c8 0.1 f en12 en34 en56 en78 en i 1n i 1p i 2n i 2p i 3n i 3p i 4n i 4p i 5n i 5p i 6n i 6p i 7n i 7p i 8n i 8p v bb o 1n o 1p o 2n o 2p o 3n o 3p o 4n o 4p o 5n o 5p o 6n o 6p o 7n o 7p o 8n o 8p v c1 v c2 v c3 v c4 v c5 12 25 26 47 48 v e1 v e2 v e3 v e4 v e5 1 2 23 36 37 u3 finii08 3.3v en12 en34 en56 en78 en i 1n i 1p i 2n i 2p i 3n i 3p i 4n i 4p i 5n i 5p i 6n i 6p i 7n i 7p i 8n i 8p v bb o 1n o 1p o 2n o 2p o 3n o 3p o 4n o 4p o 5n o 5p o 6n o 6p o 7n o 7p o 8n o 8p v c1 v c2 v c3 v c4 v c5 12 25 26 47 48 v e1 v e2 v e3 v e4 v e5 1 2 23 36 37 u3 finii08 3.3v 3 22 27 46 13 4 5 6 7 8 9 10 11 14 15 16 17 18 19 20 21 45 44 43 42 41 40 39 38 35 34 33 32 31 30 29 28 45 44 43 42 41 40 39 38 35 34 33 32 31 30 29 28 3 22 27 46 13 4 5 6 7 8 9 10 11 14 15 16 17 18 19 20 21 24 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49 51 53 56 58 60 62 64 66 68 70 72 74 76 78 80 82 84 86 88 90 92 94 96 98 100 55 57 59 61 63 65 67 69 71 73 75 77 79 81 83 85 87 89 91 93 95 97 99 r16 100k v cc 24lc02st gnd 4 224210 ai01 8 array eeprom scl sda wp a2 a1 a0 6 5 7 3 2 1 c27 0.1 f r46 4990 r29 4990 2.5v r26 4990 r1 49.9 r2 49.9 r4 4.99 r5 4.99 j7 encode clk c3 0.1 f c11 0.1 f c4 1.8pf r41 100 c13 0.1 f c14 0.1 f c15 1 f c16 1 f c17 2.2 f r23 100 c12 0.1 f c9 1.8pf r11 49.9 r12 49.9 r13 4.99 r14 4.99 r9 12.4 r10 12.4 c18 2.2 f c10 0.1 f r15 49.9 t2 maba-007159-000000 r27 49.9 a in c6 0.1 f j5 sma c2 0.1 f c7 0.1 f sma c1 0.1 f t1 maba-007159-000000 version device bits sample rate dc997b-a ltc2242-12 12 250msps dc997b-b ltc2241-12 12 210msps dc997b-c ltc2240-12 12 170msps dc997b-d ltc2242-10 10 250msps dc997b-e ltc2241-10 10 210msps dc997b-f ltc2240-10 10 170msps
25 ltc2242-10 224210fb applicatio s i for atio wu uu silkscreen top layer 1 component side layer 2 gnd plane layer 3 power/ground plane
26 ltc2242-10 224210fb applicatio s i for atio wu uu layer 4 power/ground planes layer 5 power/ground planes silk screen back, solder side layer back solder side
27 ltc2242-10 224210fb information furnished by linear technology corporation is believed to be accurate and reliable. however, no responsibility is assumed for its use. linear technology corporation makes no represen- tation that the interconnection of its circuits as described herein will not infringe on existing patent rights. u package descriptio 9 .00 0.10 (4 sides) note: 1. drawing conforms to jedec package outline mo-220 variation wnjr-5 2. all dimensions are in millimeters 3. dimensions of exposed pad on bottom of package do not include mold flash. mold flash, if present, shall not exceed 0.20mm on any side, if present 4. exposed pad shall be solder plated 5. shaded area is only a reference for pin 1 location on the top and bottom of package 6. drawing not to scale pin 1 top mark (see note 5) 0.40 0.10 64 63 1 2 bottom view?xposed pad 7.15 0.10 (4-sides) 0.75 0.05 r = 0.115 typ 0.25 0.05 0.50 bsc 0.200 ref 0.00 ?0.05 (up64) qfn 1003 recommended solder pad pitch and dimensions 0.70 0.05 7.15 0.05 (4 sides) 8.10 0.05 9.50 0.05 0.25 0.05 0.50 bsc package outline pin 1 chamfer up package 64-lead plastic qfn (9mm 9mm) (reference ltc dwg # 05-08-1705)
28 ltc2242-10 224210fb ? linear technology corporation 2006 lt 0807 rev b ?printed in usa linear technology corporation 1630 mccarthy blvd., milpitas, ca 95035-7417 (408) 432-1900 fax: (408) 434-0507 www.linear.com related parts part number description comments ltc1748 14-bit, 80msps, 5v adc 76.3db snr, 90db sfdr, 48-pin tssop ltc1750 14-bit, 80msps, 5v wideband adc up to 500mhz if undersampling, 90db sfdr lt 1993-2 high speed differential op amp 800mhz bw, 70dbc distortion at 70mhz, 6db gain lt1994 low noise, low distortion fully differential low distortion: ?4dbc at 1mhz input/output amplifier/driver ltc2202 16-bit, 10msps, 3.3v adc, lowest noise 150mw, 81.6db snr, 100db sfdr, 48-pin qfn ltc2208 16-bit, 130msps, 3.3v adc, lvds outputs 1250mw, 78db snr, 100db sfdr, 48-pin qfn ltc2220 12-bit, 170msps, 3.3v adc, lvds outputs 890mw, 67.7db snr, 84db sfdr, 64-pin qfn ltc2220-1 12-bit, 185msps, 3.3v adc, lvds outputs 910mw, 67.7db snr, 80db sfdr, 64-pin qfn ltc2221 12-bit, 135msps, 3.3v adc, lvds outputs 660mw, 67.8db snr, 84db sfdr, 64-pin qfn ltc2224 12-bit, 135msps, 3.3v adc, high if sampling 630mw, 67.6db snr, 84db sfdr, 48-pin qfn ltc2230 10-bit, 170msps, 3.3v adc, lvds outputs 890mw, 61.2db snr, 78db sfdr, 64-pin qfn ltc2231 10-bit, 135msps, 3.3v adc, lvds outputs 660mw, 61.2db snr, 78db sfdr, 64-pin qfn ltc2240-10 10-bit, 170msps, 2.5v adc, lvds outputs 445mw, 60.6db snr, 78db sfdr, 64-pin qfn ltc2240-12 12-bit, 170msps, 2.5v adc, lvds outputs 445mw, 65.5db snr, 78db sfdr, 64-pin qfn ltc2241-10 10-bit, 210msps, 2.5v adc, lvds outputs 585mw, 60.6db snr, 78db sfdr, 64-pin qfn ltc2241-12 12-bit, 210msps, 2.5v adc, lvds outputs 585mw, 65.5db snr, 78db sfdr, 64-pin qfn ltc2242-12 12-bit, 250msps, 2.5v adc, lvds outputs 740mw, 65.5db snr, 78db sfdr, 64-pin qfn ltc2255 14-bit, 125msps, 3v adc, lowest power 395mw, 72.5db snr, 88db sfdr, 32-pin qfn ltc2284 14-bit, dual, 105msps, 3v adc, low crosstalk 540mw, 72.4db snr, 88db sfdr, 64-pin qfn lt5512 dc to 3ghz high signal level downconverting mixer dc to 3ghz, 21dbm iip3, integrated lo buffer lt5514 ultralow distortion if amplifier/adc driver with 450mhz to 1db bw, 47db oip3, digital gain control digitally controlled gain 10.5db to 33db in 1.5db/step lt5515 1.5ghz to 2.5ghz direct conversion quadrature demodulator high iip3: 20dbm at 1.9ghz, integrated lo quadrature generator lt5516 800mhz to 1.5ghz direct conversion quadrature demodulator high iip3: 21.5dbm at 900mhz, integrated lo quadrature generator lt5517 40mhz to 900mhz direct conversion quadrature demodulator high iip3: 21dbm at 800mhz, integrated lo quadrature generator lt5522 600mhz to 2.7ghz high linearity downconverting mixer 4.5v to 5.25v supply, 25dbm iip3 at 900mhz, nf = 12.5db, 50 single-ended rf and lo ports


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